Modern enabling technologies, such as additive manufacturing or cavitation peening used in the aerospace and automotive industries, suffer from a lack of diagnostic tools. To date, one cannot provide relevant volumetric information about the fast processes involved. The realization of this project will break the current limits in fast, 4D X-ray microscopy by three orders of magnitude. It will be possible to visualize and characterize dynamics reaching velocities up to ~km/s for the first time with micron-scale resolutions. Instead of sample rotation, we will generate multiple X-ray probes and virtually rotate them around the sample to obtain with a single exposure multiple angular views simultaneously. Using modern X-ray sources with very high brilliance, each such 3D frame may be sampled at kHz rates at synchrotrons and even MHz rates at X-ray free-electron laser sources.

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